High-Speed I/O Loopback Broadband Conical Inductor Module
ALC-60932
Aeries Series
Developed and manufactured in-house by Toward Technologies, the ALC-60932 is a high-speed I/O loopback broadband conical inductor module. It integrates four broadband inductors and two AC-coupling capacitors in a single molded package and is designed for 85 Ω and 100 Ω differential signal paths in PCIe, SerDes, and next-generation high-speed I/O validation applications.
The ALC-60932 has demonstrated eye-diagram performance at up to 64 Gbps NRZ, with 128 Gbps PAM4 identified as an application target. Its compact 4.00*4.25*1.90 mm SMT package enables placement closer to the device under test (DUT), supporting shorter signal paths and simplified loopback circuit designs.
Each integrated broadband inductor provides an inductance of 220 nH, a maximum DC current of 230 mA, and low DC resistance of 0.6 ± 0.2 Ω, with a component-level broadband application range of up to 40 GHz. The standard AC-coupling capacitor specification is 220 nF at 6.3 V, with capacitance values customizable according to customer requirements.
Features
- Developed and manufactured in-house by Toward Technologies
- Four broadband inductors and two AC-coupling capacitors in one package
- Demonstrated eye-diagram performance up to 64 Gbps NRZ
- 128 Gbps PAM4 application target
- Designed for 85 Ω and 100 Ω differential signal paths
- Inductor broadband application range up to 40 GHz
- Inductor-path cutoff frequency below 80 MHz
- Low DC resistance of 0.6 ± 0.2 Ω
- Customizable AC-coupling capacitance
- High-reliability surface-mount molded package
- Compact 4.00*4.25*1.90 mm dimensions
Inductance
- 220 nH @ 1 MHz
Inductance Tolerance
- ±5%
Carry Current (A)
- 0.23
Frequency
- Up to 40 GHz
Inductor-Path Cutoff Frequency
- Below 80 MHz
AC-Coupling Capacitance
- 220 nF, ±10%
Capacitor Rated Voltage
- 6.3
DC Resistance (DCR)
- 0.6 ± 0.2 Ω
Application
- PCIe High-Speed I/O Loopback
- PCIe Signal Validation
- SerDes Testing and Validation
- High-Speed I/O Validation
- Differential Signal Paths
- Automated Test Equipment (ATE)
- High-Speed DUT Interface Designs
- Next-Generation Interconnect Testing